1. Can the Micro-Poise geometry system measure the full sidewall of a tire?
Yes, the Micro-Poise Geometry Inspection System (TGIS FS) offers flexible measurement capabilities. In its mono-track configuration, the system can measure a single point on the tire sidewall, which is ideal for targeted inspections. In contrast, the full-track configuration enables comprehensive measurement across the entire sidewall surface—from bead to bead, covering the full 360-degree circumference of the tire.
2. Is the geometry system compatible with other manufacturers' machines?
Yes, it can be integrated with other manufacturer’s equipment. Please contact us.
3. Can DLR licensed software filter out sidewall decorations and lettering?
Yes, it includes filtering capabilities for such features. If you require specific configuration support or want to optimize these filters for your production environment, please contact Micro-Poise technical support.
4. Can the geometry system detect missing letters or symbols on tire sidewalls?
Not currently. While Micro-Poise geometry systems capture detailed surface topography of the tire sidewall, they do not yet support Optical Character Recognition (OCR). This means that although the system can map the physical contours of the sidewall, including areas where lettering or symbols are present, it cannot currently identify or flag missing characters or symbols.
OCR functionality is a potential future enhancement and may be considered in upcoming product development roadmaps. For more information, please contact us.